Robust and Practical Measurement of Volume Transport Parameters in Solid Photo-polymer Materials for 3D Printing Oskar Elek Ran Zhang Denis Sumin Karol Myszkowski Bernd Bickel Jaroslav Křivánek Alexander Wilkie Tim Weyrich January 2021 Optics Express
Robust and Practical Measurement of Volume Transport Parameters in Solid Photo-polymer Materials for 3D Printing Oskar Elek Ran Zhang Denis Sumin Karol Myszkowski Bernd Bickel Jaroslav Křivánek Alexander Wilkie Tim Weyrich January 2021 Optics Express
Performance Evaluation of Selected 3D Keypoint Detector–Descriptor Combinations Paula Stancelova Elena Šikudová Zuzana Cernekova September 2020 ICCVG
Performance Evaluation of Selected 3D Keypoint Detector–Descriptor Combinations Paula Stancelova Elena Šikudová Zuzana Cernekova September 2020 ICCVG
Efficient Multiscale Rendering of Specular Microstructure Asen Atanasov Jaroslav Křivánek Vladimir Koylazov Alexander Wilkie August 2020 Proceedings of SIGGRAPH
Efficient Multiscale Rendering of Specular Microstructure Asen Atanasov Jaroslav Křivánek Vladimir Koylazov Alexander Wilkie August 2020 Proceedings of SIGGRAPH
Advances in Monte Carlo rendering: the legacy of Jaroslav Křivánek Alexander Keller Pascal Grittmann Jiří Vorba Iliyan Georgiev Martin Šik Eugene d'Eon Pascal Gautron Petr Vévoda Ivo Kondapaneni August 2020 SIGGRAPH Course
Advances in Monte Carlo rendering: the legacy of Jaroslav Křivánek Alexander Keller Pascal Grittmann Jiří Vorba Iliyan Georgiev Martin Šik Eugene d'Eon Pascal Gautron Petr Vévoda Ivo Kondapaneni August 2020 SIGGRAPH Course
Variance-Aware Path Guiding Alexander Rath Pascal Grittmann Sebastian Herholz Petr Vévoda Philipp Slusallek Jaroslav Křivánek July 2020 ACM Transactions on Graphics • Proceedings of SIGGRAPH
Variance-Aware Path Guiding Alexander Rath Pascal Grittmann Sebastian Herholz Petr Vévoda Philipp Slusallek Jaroslav Křivánek July 2020 ACM Transactions on Graphics • Proceedings of SIGGRAPH
MIS Compensation: Optimizing Sampling Techniques in Multiple Importance Sampling Ondřej Karlík Martin Šik Petr Vévoda Tomáš Skřivan Jaroslav Křivánek November 2019 ACM Transactions on Graphics • Proceedings of SIGGRAPH Asia
MIS Compensation: Optimizing Sampling Techniques in Multiple Importance Sampling Ondřej Karlík Martin Šik Petr Vévoda Tomáš Skřivan Jaroslav Křivánek November 2019 ACM Transactions on Graphics • Proceedings of SIGGRAPH Asia
Variance-Aware Multiple Importance Sampling Jaroslav Křivánek Pascal Grittmann Iliyan Georgiev Philipp Slusallek November 2019 ACM Transactions on Graphics • Proceedings of SIGGRAPH Asia
Variance-Aware Multiple Importance Sampling Jaroslav Křivánek Pascal Grittmann Iliyan Georgiev Philipp Slusallek November 2019 ACM Transactions on Graphics • Proceedings of SIGGRAPH Asia
Integral formulations of volumetric transmittance Iliyan Georgiev Jaroslav Křivánek Zackary Misso Toshiya Hachisuka Derek Nowrouzezahrai Wojciech Jarosz November 2019 ACM Transactions on Graphics • Proceedings of SIGGRAPH Asia
Integral formulations of volumetric transmittance Iliyan Georgiev Jaroslav Křivánek Zackary Misso Toshiya Hachisuka Derek Nowrouzezahrai Wojciech Jarosz November 2019 ACM Transactions on Graphics • Proceedings of SIGGRAPH Asia
Quantum Yield Bias in Materials With Lower Absorptance Bart van Dam Benjamin Bruhn Ivo Kondapaneni Gejza Dohnal Alexander Wilkie Jaroslav Křivánek Jan Valenta Yvo D. Mudde Peter Schall Kateřina Dohnalová August 2019 Physical Review Applied
Quantum Yield Bias in Materials With Lower Absorptance Bart van Dam Benjamin Bruhn Ivo Kondapaneni Gejza Dohnal Alexander Wilkie Jaroslav Křivánek Jan Valenta Yvo D. Mudde Peter Schall Kateřina Dohnalová August 2019 Physical Review Applied
Path guiding in production Jiří Vorba Johannes Hanika Sebastian Herholz Thomas Müller Jaroslav Křivánek Alexander Keller August 2019 ACM Course • SIGGRAPH Course
Path guiding in production Jiří Vorba Johannes Hanika Sebastian Herholz Thomas Müller Jaroslav Křivánek Alexander Keller August 2019 ACM Course • SIGGRAPH Course
